X-ray Microanalysis Artifacts Visualized

Interdisciplinary X-Ray Microanalysis: From Planets and Comets to Artifacts and Fine Art

A cryogenic microcalorimeter x-ray spectrometer is coupled to an FEI XL30 environmental scanning electron microscope (ESEM). The microcalorimeter is designed to obtain high resolution broadband xray spectra in the energy range of 150 eV to 10 keV. An x-ray optic enhances the solid angle for x-ray energies between 150 eV and 2300 eV. This enables precise microanalysis with relatively low energy ...

X-Ray microanalysis of stratified specimens

This paper presents a description of the state of the art methodology and software for the application of x-ray microanalysis to thin surface layers and more generally to the characterization of stratified specimens. The sensitivity of the technique to near-surface segregation is demonstrated. Some emphasis is given on the eS(pz) function (the distribution in depth of the primary generated x-ra...

X-ray microanalysis attachment for electron microscope.

Fundamental Constants for Quantitative X-ray Microanalysis.

Quantitative X-ray microanalysis requires the use of many fundamental constants related to the interaction of the electron beam with the sample. The current state of our knowledge of such constants in the particular areas of electron stopping power, X-ray ionization cross-sections, X-ray fluorescence yield, and the electron backscattering yield, is examined. It is found that, in every case, the...

Artifacts in X-ray CT